Ключевые слова: HTS, YBCO, multilayered structures, films thick, PLD process, interfaces, dislocations, Jc/B curves, substrate SrTiO3, fabrication, critical caracteristics
Yoshida Y., Matsumoto K., Ichino Y., Takai Y., Horii S., Mukaida M., Ichinose A., Miura M., Ozaki T.
Ключевые слова: HTS, YBCO, films thick, substrate Ag, magnetic shielding, resistance, temperature dependence, magnetic induction, experimental results, screen
Wang S.Q.(Sheng-Qi.Wang@hanscom.af.mil), Zhang J.Z., Markiewicz R.S., Giessen B.C.
Ключевые слова: HTS, REBCO, films thick, fabrication, substrates, YBCO, coated conductors, texture
Gritzner G., Prazuch J., Przybylski K.(kaz@agh.edu.pl), Morgiel J.
Ключевые слова: HTS, films thick, screen printing, substrate polycrystalline, microstructure, interfaces, fabrication
Ключевые слова: HTS, REBCO, films thick, texture, substrates, YBCO, coated conductors, experimental results
Henrist C., Vanderbemden P., Cloots R., Vertruyen B., Denis S., Dusoulier L.(L.Dusoulier@ulg.ac.be), Fagnard J., Vanderheyden B., Rulmont A., Dirickx M., Ausloos M.34
Ключевые слова: HTS, YBCO, films thick, substrate Ag, microstructure, fabrication
Puig T., Obradors X., Pomar A., Roma N., Ricart S., Moreto J.M., Morlens S.(smorlens@icmab.es)
Ключевые слова: MgB2, films thick, substrate Cu, CVD process, microstructure, upper critical fields, fabrication, critical caracteristics, magnetic properties
Yamasaki H., Nakagawa Y., Obara H., Nie J.C.(jcnie@bnu.edu.cn), Develos-Bagarinao K., Murugesan M., Mawatari Y.
Ключевые слова: HTS, YBCO, films thick, substrate sapphire, buffer layers, crack formation, Jc/B curves, thickness dependence, fabrication, critical caracteristics
Vanderbemden P., Ausloos M., Cloots R., Grenci G., Dusoulier L., Vanderheyden B., Dirickx M., Denis S(sdenis@ulg.ac.be)*1)
Ключевые слова: HTS, YBCO, films thick, substrate Ag, electrodeposition, magnetic shielding, fabrication, experimental results
Ключевые слова: HTS, Bi2212, films thick, substrate Ag, coatings, fabrication
Chen M., Sager D.(david.sager@mat.ethz.ch), Meier L.P., Gauckler L.J.
Ключевые слова: HTS, Bi2212, bulk, phase formation, microstructure, films thick, critical current density, fabrication, critical caracteristics
Ключевые слова: patents, films epitaxial, fabrication, substrate single crystal, substrates, buffer layers, HTS, YBCO, films thick
Yamasaki H., Nakagawa Y., Obara H., Nie J.C.(jcnie@bnu.edu.cn), Develos-Bagarinao K., Murugesan M., Mawatari Y.
Ключевые слова: HTS, YBCO, films thick, films epitaxial, substrate single crystal, buffer layers, PLD process, microstructure, Jc/B curves, critical caracteristics, fabrication
Ключевые слова: HTS, YBCO, films thick, thermal stability, trapped field, vortex dynamics, flux creep, numerical analysis, magnetic properties, dynamic operation
Matsumura T., Kado H., Ichikawa M., Shibuya M., Kojima M.(kojimam@dowa.co.jp), Kawahara M.
Choi M., Iluyshechkin A., Agranovski I.E.(i.agranovski@griffith.edu.au), Altman I.S., Racha N.
Ключевые слова: HTS, Bi2212, films thick, fabrication, nanodoping, grain alignment, substrate Ag, Jc/B curves, temperature dependence, microstructure, critical caracteristics
Ignatiev A., Zhang X., ZENG J.(jmzeng@svec.uh.edu), Rusakova I., Tang Z., Sanchez D., MOLODYK A., Wu N.
Ключевые слова: HTS, YBCO, films thick, MOCVD process, growth rate, coated conductors, fabrication
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